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Optical Simulation Software
Optical Disk Media Evaluation Hardware
Considering purchase of the product, please from Contact Us page.
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15.mgrooves1
Description:
Focused beam, wavelength 650nm,
incident on a multilayer stack with grooves.
Structure, top to bottom:
layer1 n=1.5
layer2 ZnS-SiO2 layer, 70nm thickness
layer3 Ge2Sb2Te5 layer, 34nm thickness
layer4 ZnS-SiO2 layer, 34nm thickness
layer5 Al layer plus grooves
Input files:
parameters.input
boundaries.input
geometry.input
material.input
S000.DAT - input beam distribution computed with DIFFRACT COMMAND.DAT
Output files:
fdtd.grating.r - computed reflected field distribution in xy-plane
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