 |
 |
 |
 |
光学解析ソフト
光ディスク評価装置
製品のご購入をお考えの方は、 お問い合わせ ページよりお問い合わせください。
|
 |
 |
 |
 |
|
PDFファイルを閲覧・印刷になるには、Adobe Reader®が必要です。ダウンロードはこちらから。
|
|
|
3.bowrite
Description:
Focused beam, wavelength 650nm,
incident from air on the 20nm aluminum layer with a
bowtie aperture.
Structure, top to bottom:
layer1 n=1.0
layer2 20nm Al, n+ik=2+7i layer plus aperture
of two triangles and a rectangle forming
bowtie (400nm extent in x and 300nm in y)
filled with n=1.0
layer3 n=1.5
distance from Al top to R plane=77nm
distance from Al bottom t T plane=20nm
Lx,y=12*lambda=7800nm
Input files:
parameters.input
boundaries.input
geometry.input
material.input
S000.DAT - input beam distribution computed with DIFFRACT COMMAND.DAT
Output files:
fdtd.bowtie.r - computed reflected field distribution in xy-plane
fdtd.bowtie.t - computed field distribution in xy-plane at z=-50nm
 
|
