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光学解析ソフト
光ディスク評価装置
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21.pit
1. Description:
Focused beam, wavelength 650nm,
incident from air on the aluminum layer with a single
sphero-cylindrical pit, centered at (x,y)=(0nm,0nm).
Structure, top to bottom:
layer1 n=1.0
layer2 50nm Al, n+ik=2+7i layer plus spherocylindrical pit
with total length=500nm, width=300nm, height=100nm
layer3 n=1.5
distance from Al layer top to R plane=280nm
Lx,y=12*lambda=7800nm
Input files:
parameters0.input
boundaries.input
geometry0.input
material.input
S000.DAT - input beam distribution computed with DIFFRACT COMMAND.DAT
Output files:
fdtd.pit0.r - computed reflected field distribution in xy-plane
 
2. Description:
Focused beam, wavelength 650nm,
incident from air on the aluminum layer with a single
sphero-cylindrical pit, centered at (x,y)=(-250nm,0nm).
Structure, top to bottom:
layer1 n=1.0
layer2 50nm Al, n+ik=2+7i layer plus spherocylindrical pit
with total length=500nm, width=300nm, height=100nm
layer3 n=1.5
distance from Al layer top to R plane=280nm
Lx,y=12*lambda=7800nm
Input files:
parameters0.input
boundaries.input
geometry0.input
material.input
S000.DAT - input beam distribution computed with DIFFRACT COMMAND.DAT
Output files:
fdtd.pit1.r - computed reflected field distribution in xy-plane
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