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4.bumps

1. Description:
  Focused beam, wavelength 650nm,
  incident through a substrate on the aluminum layer with two
  sphero-cylindrical bumps, centered at (x,y)=(-300nm,0nm) and (300nm,0nm)

  Structure, top to bottom:
     layer1   n=1.5
     layer2   50nm Al, n+ik=2+7i layer plus 2 spherocylindrical bumps
              with total length=500nm, width=300nm, height=100nm
     layer3   n=1.0
  distance from Al layer top to R plane=280nm
  Lx,y=12*lambda/1.5=5200nm

Input files:
  parameters.input
  boundaries.input
  geometry.input
  material.input
  S000.DAT - input beam distribution computed with DIFFRACT COMMAND.DAT
 
Output files:
  fdtd.bumps.r - computed reflected field distribution in xy-plane

 

2. Description:
  Focused beam, wavelength 650nm,
  incident through a substrate on the aluminum layer with a
  sphero-cylindrical bump, centered at (x,y)=(0nm,0nm)


  Structure, top to bottom:
     layer1   n=1.5
     layer2   50nm Al, n+ik=2+7i layer plus 2 spherocylindrical bumps
              with total length=500nm, width=300nm, height=100nm
     layer3   n=1.0
  distance from Al layer top to R plane=280nm
  Lx,y=12*lambda/1.5=5200nm

Input files:
  parameters0.input
  boundaries.input
  geometry0.input
  material.input
  S000.DAT - input beam distribution computed with DIFFRACT COMMAND.DAT
 
Output files:
  fdtd.bumps0.r - computed reflected field distribution in xy-plane

3. Description:
  Focused beam, wavelength 650nm,
  incident through a substrate on the aluminum layer with a
  sphero-cylindrical bump, centered at (x,y)=(-250nm,0nm)


  Structure, top to bottom:
     layer1   n=1.5
     layer2   50nm Al, n+ik=2+7i layer plus 2 spherocylindrical bumps
              with total length=500nm, width=300nm, height=100nm
     layer3   n=1.0
  distance from Al layer top to R plane=280nm
  Lx,y=12*lambda/1.5=5200nm

Input files:
  parameters1.input
  boundaries.input
  geometry1.input
  material.input
  S000.DAT - input beam distribution computed with DIFFRACT COMMAND.DAT
 
Output files:
  fdtd.bumps1.r - computed reflected field distribution in xy-plane





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